Course Objectives & Content
- Comprehensive understanding of X-ray Photoelectron Spectroscopy
- Overview of instrumentation aspects
- Best practices in the analysis of surfaces
- Overview of typical problems and how to cope with them
- Advanced data analysis
- Results interpretation and presentation
This course offers a comprehensive overview of all aspects essential for successful XPS analyses of thin film samples. Topics covered include experimental planning, sample selection and handling, instrument setup, data acquisition, spectra analysis, and results presentation. Particular attention is paid to the correct workflow, development of good research practices, and solid knowledge of factors that impact the quality and reliability of the obtained information. Numerous application examples highlight the broad range of research questions that can be answered by XPS. The topic selection and the discussion level are accessible for novices yet challenging possible preconceptions of experienced practitioners. While analyses of thin film samples are chosen for model cases, the majority of discussed topics are applicable to surface science in general and are, thus, of relevance for the analyses of any type of sample and material class.
Who Should Attend?
Graduate students, scientists and engineers who want to learn about plasmas in deposition processes.
Grzegorz (Greg) Greczynski
Senior Associated Professor of Material Science, Linköping University